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Chris Schuermyer
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2010 – 2019
- 2013
- [j4]Shobhit Malik, Thomas Herrmann, Sriram Madhavan
, Rao Desineni, Chris Schuermyer, Geir Eide:
Deriving Feature Fail Rate from Silicon Volume Diagnostics Data. IEEE Des. Test 30(4): 26-34 (2013) - 2012
- [j3]Brady Benware, Chris Schuermyer, Manish Sharma, Thomas Herrmann:
Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results. IEEE Des. Test Comput. 29(1): 8-18 (2012) - [c10]Jianbo Li, Yu Huang, Wu-Tung Cheng, Chris Schuermyer, Dong Xiang, Eric Faehn, Ruth Farrugia:
A Hybrid Flow for Memory Failure Bitmap Classification. Asian Test Symposium 2012: 314-319 - 2010
- [j2]Manish Sharma, Chris Schuermyer, Brady Benware:
Determination of Dominant-Yield-Loss Mechanism with Volume Diagnosis. IEEE Des. Test Comput. 27(3): 54-61 (2010)
2000 – 2009
- 2007
- [c9]Chris Schuermyer, Jewel Pangilinan, Jay Jahangiri, Martin Keim, Janusz Rajski, Brady Benware:
Silicon Evaluation of Static Alternative Fault Models. VTS 2007: 265-270 - 2006
- [j1]Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer:
Extracting Defect Density and Size Distributions from Product ICs. IEEE Des. Test Comput. 23(5): 390-400 (2006) - [c8]Martin Keim, Nagesh Tamarapalli, Huaxing Tang, Manish Sharma, Janusz Rajski, Chris Schuermyer, Brady Benware:
A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis. ITC 2006: 1-10 - 2005
- [c7]Chris Schuermyer:
Achieving higher yield through diagnosis-the ASIC perspective. ITC 2005: 2 - [c6]Chris Schuermyer, Kevin Cota, Robert Madge, Brady Benware:
Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis. ITC 2005: 9 - 2004
- [c5]Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler:
In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. ITC 2004: 203-212 - [c4]Chris Schuermyer, Jens Ruffler, W. Robert Daasch:
Minimum Testing Requirements to Screen Temperature Dependent Defects. ITC 2004: 300-308 - 2003
- [c3]Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning:
Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. ITC 2003: 565-573 - [c2]Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski:
Impact of Multiple-Detect Test Patterns on Product Quality. ITC 2003: 1031-1040 - 2002
- [c1]Robert Madge, B. H. Goh, V. Rajagopalan, C. Macchietto, W. Robert Daasch, Chris Schuermyer, C. Taylor, David Turner:
Screening MinVDD Outliers Using Feed-Forward Voltage Testing. ITC 2002: 673-682
Coauthor Index
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