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Piet Dewaele

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1990 – 1999

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1999
[c4]
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  - conf/miccai/BehielsVMSD99
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Gert Behiels, Dirk Vandermeulen, Frederik Maes, Paul Suetens, Piet Dewaele:
Active Shape Model-Based Segmentation of Digital X-ray Images. MICCAI 1999: 128-137
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Piet Dewaele, Pieter Vuylsteke, S. Van de Velde, Emile P. Schoeters:
Full-leg/full-spine image stitching: a new and accurate CR-based imaging technique. Image Processing 1999

1980 – 1989

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1988
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Piet Dewaele, Luc Van Gool, Patrick Wambacq, André Oosterlinck:
Texture inspection with self-adaptive convolution filters. ICPR 1988: 56-60
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Patrick Wambacq, Piet Dewaele, Rudi Bartels, Johan Vandeneede, Dirk Van Den Oudenhoven, André Oosterlinck:
Some Visual Inspection Problems in the Belgian Industry (Invited). MVA 1988: 388-396
1985
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Luc Van Gool, Piet Dewaele, André Oosterlinck:
Texture analysis Anno 1983. Comput. Vis. Graph. Image Process. 29(3): 336-357 (1985)

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