default search action
Friedrich Hapke
Person information
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2020 – today
- 2021
- [j6]Friedrich Hapke
, Will Howell
Defect-Oriented Test: Effectiveness in High Volume Manufacturing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(3): 584-597 (2021)
2010 – 2019
- 2018
- [c29]Friedrich Hapke, Peter C. Maxwell:
Total Critical Area Based Testing. ITC 2018: 1-10 - [c28]Will Howell, Friedrich Hapke, Edward Brazil, Srikanth Venkataraman, R. Datta, Andreas Glowatz, Wilfried Redemund, J. Schmerberg, Anja Fast, Janusz Rajski:
DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies. ITC 2018: 1-10 - 2017
- [c27]Peter C. Maxwell, Friedrich Hapke, Maija Ryynaenen, Peter Weseloh:
Bridge over troubled waters: Critical area based pattern generation. ETS 2017: 1-6 - 2016
- [j5]Cesar Acero, Derek Feltham, Marek Patyra, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee, Vidya Neerkundar, Janusz Rajski, Jerzy Tyszer, Justyna Zawada:
On New Test Points for Compact Cell-Aware Tests. IEEE Des. Test 33(6): 7-14 (2016) - [c26]Peter C. Maxwell, Friedrich Hapke, Huaxing Tang:
Cell-aware diagnosis: Defective inmates exposed in their cells. ETS 2016: 1-6 - 2015
- [c25]Cesar Acero, Derek Feltham, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee, Vidya Neerkundar, Marek Patyra, Janusz Rajski, Jerzy Tyszer, Justyna Zawada:
Embedded deterministic test points for compact cell-aware tests. ITC 2015: 1-8 - [c24]Huaxing Tang, Ting-Pu Tai, Wu-Tung Cheng, Brady Benware, Friedrich Hapke:
Diagnosing timing related cell internal defects for FinFET technology. VLSI-DAT 2015: 1-4 - 2014
- [j4]Friedrich Hapke, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, Michael Reese, Marek Hustava, Martin Keim, Juergen Schloeffel, Anja Fast:
Cell-Aware Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(9): 1396-1409 (2014) - [c23]Huaxing Tang, Brady Benware, Michael Reese, Joseph Caroselli, Thomas Herrmann, Friedrich Hapke, Robert Tao, Wu-Tung Cheng, Manish Sharma:
Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault Models. ATS 2014: 318-323 - [c22]Friedrich Hapke, Ralf Arnold, Matthias Beck, M. Baby, S. Straehle, J. F. Goncalves, A. Panait, R. Behr, Gwenolé Maugard, A. Prashanthi, Juergen Schloeffel, Wilfried Redemund, Andreas Glowatz, Anja Fast, Janusz Rajski:
Cell-aware experiences in a high-quality automotive test suite. ETS 2014: 1-6 - 2013
- [c21]Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke:
Fault collapsing of multi-conditional faults. DDECS 2013: 42-47 - [c20]Martin Keim, Tom Waayers, Richard Morren, Friedrich Hapke, Rene Krenz-Baath:
Industrial Application of IEEE P1687 for an Automotive Product. DSD 2013: 453-461 - 2012
- [c19]Erik Jan Marinissen, Gilbert Vandling, Sandeep Kumar Goel, Friedrich Hapke, Jason Rivers, Nikolaus Mittermaier, Swapnil Bahl:
EDA solutions to new-defect detection in advanced process technologies. DATE 2012: 123-128 - [c18]Stephan Eggersglüß, Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke, Rolf Drechsler
A new SAT-based ATPG for generating highly compacted test sets. DDECS 2012: 230-235 - [c17]Rene Krenz-Baath, Friedrich Hapke, Rolf Hinze, Reinhard Meier, Maija Ryynaenen, Andreas Glowatz:
Robust Evaluation of Weighted Random Logic BIST Structures in Industrial Designs. DSD 2012: 823-829 - [c16]Friedrich Hapke, Jürgen Schlöffel:
Introduction to the defect-oriented cell-aware test methodology for significant reduction of DPPM rates. ETS 2012: 1-6 - [c15]Friedrich Hapke, Michael Reese, Jason Rivers, A. Over, V. Ravikumar, Wilfried Redemund, Andreas Glowatz, Jürgen Schlöffel, Janusz Rajski:
Cell-aware Production test results from a 32-nm notebook processor. ITC 2012: 1-9 - 2011
- [c14]Friedrich Hapke, Jürgen Schlöffel, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, Michael Reese, J. Rearick, Jason Rivers:
Cell-aware analysis for small-delay effects and production test results from different fault models. ITC 2011: 1-8 - 2010
- [j3]Stephan Eggersglüß, Görschwin Fey
MONSOON: SAT-Based ATPG for Path Delay Faults Using Multiple-Valued Logics. J. Electron. Test. 26(3): 307-322 (2010) - [c13]Friedrich Hapke, Wilfried Redemund, Jürgen Schlöffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, Stefan Eichenberger:
Defect-oriented cell-internal testing. ITC 2010: 285-294
2000 – 2009
- 2009
- [c12]Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson:
Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. ITC 2009: 1-10 - [c11]Marc Messing, Andreas Glowatz, Friedrich Hapke, Rolf Drechsler
Using a two-dimensional fault list for compact Automatic Test Pattern Generation. LATW 2009: 1-6 - [c10]Abdul Wahid Hakmi, Stefan Holst, Hans-Joachim Wunderlich, Jürgen Schlöffel, Friedrich Hapke, Andreas Glowatz:
Restrict Encoding for Mixed-Mode BIST. VTS 2009: 179-184 - 2008
- [j2]Rolf Drechsler
On Acceleration of SAT-Based ATPG for Industrial Designs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(7): 1329-1333 (2008) - 2007
- [c9]Stephan Eggersglüß, Daniel Tille, Görschwin Fey
Experimental Studies on SAT-Based ATPG for Gate Delay Faults. ISMVL 2007: 6 - [c8]Jeroen Geuzebroek, Erik Jan Marinissen
Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects. ITC 2007: 1-10 - [c7]Abdul Wahid Hakmi, Hans-Joachim Wunderlich, Christian G. Zoellin, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Laurent Souef:
Programmable deterministic Built-In Self-Test. ITC 2007: 1-9 - [c6]Stephan Eggersglüß, Görschwin Fey
Combining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults. MEMOCODE 2007: 181-187 - 2006
- [j1]Yuyi Tang, Hans-Joachim Wunderlich, Piet Engelke, Ilia Polian, Bernd Becker
X-masking during logic BIST and its impact on defect coverage. IEEE Trans. Very Large Scale Integr. Syst. 14(2): 193-202 (2006) - [c5]Harald P. E. Vranken, Sandeep Kumar Goel, Andreas Glowatz, Jürgen Schlöffel, Friedrich Hapke:
Fault detection and diagnosis with parity trees for space compaction of test responses. DAC 2006: 1095-1098 - 2005
- [c4]Junhao Shi, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel:
PASSAT: Efficient SAT-Based Test Pattern Generation for Industrial Circuits. ISVLSI 2005: 212-217 - 2004
- [c3]Valentin Gherman, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Michael Garbers:
Efficient Pattern Mapping for Deterministic Logic BIST. ITC 2004: 48-56 - [c2]Yuyi Tang, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Piet Engelke, Ilia Polian, Bernd Becker:
X-Masking During Logic BIST and Its Impact on Defect Coverage. ITC 2004: 442-451 - 2003
- [c1]Harald P. E. Vranken, Friedrich Hapke, Soenke Rogge, Domenico Chindamo, Erik H. Volkerink:
ATPG Padding And ATE Vector Repeat Per Port For Reducing Test Data Volume. ITC 2003: 1069-1078
Coauthor Index
aka: Juergen Schloeffel
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from ,
, and
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and
to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from .
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-04-24 22:49 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by: