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"Parallel test generation with low communication overhead."

Sivaramakrishnan Venkatraman, Sharad C. Seth, Prathima Agrawal (1995)

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DOI: 10.1109/ICVD.1995.512088

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Sivaramakrishnan Venkatraman, Sharad C. Seth, Prathima Agrawal:
Parallel test generation with low communication overhead. VLSI Design 1995: 116-120

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