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"Iterative ESO-Based Data-Driven Active Disturbance Rejection Learning ..."

Jun-Chao Ren et al. (2024)

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DOI: 10.23919/ACC60939.2024.10645058

access: closed

type: Conference or Workshop Paper

metadata version: 2024-09-21

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  dblp key:
  - conf/amcc/RenLWSL24
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Jun-Chao Ren, Ding Liu, Yin Wan, Shuyan Shi, Yuyu Liu:
Iterative ESO-Based Data-Driven Active Disturbance Rejection Learning Control of Czochralski Silicon Single Crystal Growth Process. ACC 2024: 2905-2910

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