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"Impact of HALO structure on threshold voltage and leakage current in 45nm ..."

Fauziyah Salehuddin et al. (2010)

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DOI: 10.1109/APCCAS.2010.5774934

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Fauziyah Salehuddin, Ibrahim Ahmad, Fazrena Azlee Hamid, Azami Zaharim:
Impact of HALO structure on threshold voltage and leakage current in 45nm NMOS device. APCCAS 2010: 1147-1150

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