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"An algebraic approach to test generation for sequential circuits."

Antonio Lioy et al. (1991)

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DOI: 10.1109/GLSV.1991.143952

access: closed

type: Conference or Workshop Paper

metadata version: 2021-04-09

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Antonio Lioy, Enrico Macii, Angelo Raffaele Meo, Matteo Sonza Reorda:
An algebraic approach to test generation for sequential circuits. Great Lakes Symposium on VLSI 1991: 115-120

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