<?xml version="1.0" encoding="US-ASCII"?>
<dblp>
<inproceedings key="conf/i2mtc/WangJHDKF23" mdate="2024-01-26">
<author>Shenghan Wang</author>
<author>Chun Jiang</author>
<author>Yu Hu</author>
<author>Zhaoqi Duan</author>
<author>Yihua Kang</author>
<author>Bo Feng 0001</author>
<title>Simultaneous imaging defect and measuring lift-off using a double layer parallel-cable-based probe.</title>
<pages>1-6</pages>
<year>2023</year>
<booktitle>I2MTC</booktitle>
<ee>https://doi.org/10.1109/I2MTC53148.2023.10176091</ee>
<crossref>conf/i2mtc/2023</crossref>
<url>db/conf/i2mtc/i2mtc2023.html#WangJHDKF23</url>
</inproceedings>
</dblp>
