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"On-Chip Delay Measurement Circuit for Reliability Characterization of SRAM."

Pankaj Verma et al. (2016)

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DOI: 10.1109/ISVLSI.2016.24

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/isvlsi/VermaHPB16
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  persistent URL:
  - https://dblp.org/rec/conf/isvlsi/VermaHPB16
Pankaj Verma, Rohit Halba, Hemant Patel, Maryam Shojaei Baghini:
On-Chip Delay Measurement Circuit for Reliability Characterization of SRAM. ISVLSI 2016: 331-336

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