BibTeX record conf/iri/WangLLCZW22

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@inproceedings{DBLP:conf/iri/WangLLCZW22,
  author       = {Xiaoliang Wang and
                  Justin Lowery and
                  Yongjin Lu and
                  Wei{-}bang Chen and
                  Shanshan Zhang and
                  Zhenhua Wu},
  title        = {Embracing Deep Learning for Crack Segmentation in {SEM} Images of
                  Metal Additive Manufacturing},
  booktitle    = {23rd {IEEE} International Conference on Information Reuse and Integration
                  for Data Science, {IRI} 2022, San Diego, CA, USA, August 9-11, 2022},
  pages        = {18--19},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IRI54793.2022.00017},
  doi          = {10.1109/IRI54793.2022.00017},
  timestamp    = {Sat, 30 Sep 2023 09:49:23 +0200},
  biburl       = {https://dblp.org/rec/conf/iri/WangLLCZW22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}