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"Reliability aspects of ferroelectric hafnium oxide for application in ..."

Halid Mulaosmanovic et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405215

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Halid Mulaosmanovic, Patrick D. Lomenzo, Uwe Schroeder, Stefan Slesazeck, Thomas Mikolajick, Benjamin Max:
Reliability aspects of ferroelectric hafnium oxide for application in non-volatile memories. IRPS 2021: 1-6

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