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"Self-heating characterization of FinFET SOI devices using 2D time resolved ..."

Franco Stellari et al. (2015)

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DOI: 10.1109/IRPS.2015.7112672

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Franco Stellari, Keith A. Jenkins, Alan J. Weger, Barry P. Linder, Peilin Song:
Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements. IRPS 2015: 2

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