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"Design and Heavy-Ion Testing of MTJ/CMOS Hybrid LSIs for Space-Grade ..."

K. Watanabe et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764491

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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  dblp key:
  - conf/irps/WatanabeSHSKTIS22
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  - https://dblp.org/rec/conf/irps/WatanabeSHSKTIS22
K. Watanabe, T. Shimada, K. Hirose, H. Shindo, D. Kobayashi, Takaho Tanigawa, Shoji Ikeda, Takamitsu Shinada, Hiroki Koike, Tetsuo Endoh, T. Makino, Takeshi Ohshima:
Design and Heavy-Ion Testing of MTJ/CMOS Hybrid LSIs for Space-Grade Soft-Error Reliability. IRPS 2022: 54-1

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