BibTeX record conf/itc-asia/ZhangCZ25

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@inproceedings{DBLP:conf/itc-asia/ZhangCZ25,
  author       = {Haotian Zhang and
                  Shurong Cao and
                  Ningmu Zou},
  title        = {{FALCO-WAFER:} Feature-Aware Lightweight Contextual Detector for Wafer
                  Defect Detection},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2025, Tokyo,
                  Japan, December 16-19, 2025},
  pages        = {43--47},
  publisher    = {{IEEE}},
  year         = {2025},
  url          = {https://doi.org/10.1109/ITC-Asia67627.2025.00016},
  doi          = {10.1109/ITC-ASIA67627.2025.00016},
  timestamp    = {Sat, 28 Mar 2026 14:29:16 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/ZhangCZ25.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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