default search action

combined dblp search
author search
venue search
publication search

ask others

"Effective DC fault models and testing approach for open defects in analog ..."

Baris Esen et al. (2016)

> Home

Details and statistics

DOI: 10.1109/TEST.2016.7805830

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-02

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/itc/EsenCGDV16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/EsenCGDV16
Baris Esen, Anthony Coyette, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren:
Effective DC fault models and testing approach for open defects in analog circuits. ITC 2016: 1-9

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.