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"A static noise impact analysis methodology for evaluating transient error ..."

Chong Zhao, Xiaoliang Bai, Sujit Dey (2005)

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DOI: 10.1109/TEST.2005.1584071

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Chong Zhao, Xiaoliang Bai, Sujit Dey:
A static noise impact analysis methodology for evaluating transient error effects in digital VLSI circuits. ITC 2005: 10

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