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"Revisiting Dependence Cluster Metrics based Defect Prediction."

Qiguo Huang et al. (2020)

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DOI: 10.18293/SEKE2020-060

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-12

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  dblp key:
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  - https://dblp.org/rec/conf/seke/0005LNGH20
Qiguo Huang, Xiang Chen, Zhengliang Li, Chao Ni, Qing Gu:
Revisiting Dependence Cluster Metrics based Defect Prediction. SEKE 2020: 329-334

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