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"Heterogeneous cross-company defect prediction by unified metric ..."

Xiao-Yuan Jing et al. (2015)

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DOI: 10.1145/2786805.2786813

access: closed

type: Conference or Workshop Paper

metadata version: 2021-04-09

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  dblp key:
  - conf/sigsoft/JingWDQX15
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Xiao-Yuan Jing, Fei Wu, Xiwei Dong, Fumin Qi, Baowen Xu:
Heterogeneous cross-company defect prediction by unified metric representation and CCA-based transfer learning. ESEC/SIGSOFT FSE 2015: 496-507

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