default search action

combined dblp search
author search
venue search
publication search

ask others

Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCID

"Fast sensitivity analysis of defective system."

Tao Xu et al. (2010)

> Home

Details and statistics

DOI: 10.1016/J.AMC.2010.08.057

access: closed

type: Journal Article

metadata version: 2024-05-07

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/amc/XuXZH10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/amc/XuXZH10
Tao Xu, Tianshuang Xu, Wenjie Zuo, Liang Hao:
Fast sensitivity analysis of defective system. Appl. Math. Comput. 217(7): 3248-3256 (2010)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.