default search action

combined dblp search
author search
venue search
publication search

ask others

"Pattern Reorder for Test Cost Reduction Through Improved SVMRANK Algorithm."

Tai Song et al. (2020)

> Home

Details and statistics

DOI: 10.1109/ACCESS.2020.3016039

access: open

type: Journal Article

metadata version: 2021-09-16

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/access/SongLNHLWY20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/access/SongLNHLWY20
Tai Song, Huaguo Liang, Tianming Ni, Zhengfeng Huang, Yingchun Lu, Jinlei Wan, Aibin Yan:
Pattern Reorder for Test Cost Reduction Through Improved SVMRANK Algorithm. IEEE Access 8: 147965-147972 (2020)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.