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"IDD-Net: Industrial defect detection method based on Deep-Learning."

Zekai Zhang et al. (2023)

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DOI: 10.1016/J.ENGAPPAI.2023.106390

access: closed

type: Journal Article

metadata version: 2024-12-11

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  - https://dblp.org/rec/journals/eaai/ZhangZWL0H23
Zekai Zhang, Mingle Zhou, Honglin Wan, Min Li, Gang Li, Delong Han:
IDD-Net: Industrial defect detection method based on Deep-Learning. Eng. Appl. Artif. Intell. 123(Part B): 106390 (2023)

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