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"Increasing the Fault Coverage of Processor Devices during the Operational ..."

Mauricio de Carvalho et al. (2014)

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DOI: 10.1007/S10836-014-5457-5

access: closed

type: Journal Article

metadata version: 2021-07-25

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Mauricio de Carvalho, Paolo Bernardi, Ernesto Sánchez, Matteo Sonza Reorda, Oscar Ballan:
Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test. J. Electron. Test. 30(3): 317-328 (2014)

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