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"A Low-Cost Reliability vs. Cost Trade-Off Methodology to Selectively ..."

Imran Wali et al. (2017)

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DOI: 10.1007/S10836-017-5640-6

access: closed

type: Journal Article

metadata version: 2023-03-21

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  - https://dblp.org/rec/journals/et/WaliDVBGR17
Imran Wali, Bastien Deveautour, Arnaud Virazel, Alberto Bosio, Patrick Girard, Matteo Sonza Reorda:
A Low-Cost Reliability vs. Cost Trade-Off Methodology to Selectively Harden Logic Circuits. J. Electron. Test. 33(1): 25-36 (2017)

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