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"Impurity Diffusion in InGaAs Esaki Tunnel Diodes of Varied Defect Densities."

Hideki Ono, Satoshi Taniguchi, Toshi-kazu Suzuki (2006)

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DOI: 10.1093/IETELE/E89-C.7.1020

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/OnoTS06
Hideki Ono, Satoshi Taniguchi, Toshi-kazu Suzuki:
Impurity Diffusion in InGaAs Esaki Tunnel Diodes of Varied Defect Densities. IEICE Trans. Electron. 89-C(7): 1020-1024 (2006)

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