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"Identification and Application of Invariant Critical Paths under NBTI ..."

Song Bian et al. (2017)

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DOI: 10.1587/TRANSFUN.E100.A.2797

access: closed

type: Journal Article

metadata version: 2024-06-17

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  dblp key:
  - journals/ieicet/BianMSAHS17
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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/BianMSAHS17
Song Bian, Shumpei Morita, Michihiro Shintani, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato:
Identification and Application of Invariant Critical Paths under NBTI Degradation. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 100-A(12): 2797-2806 (2017)

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