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"AlGaN channel MIS-HEMTs with a very high breakdown electric field and ..."

Xiangdong Li et al. (2015)

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DOI: 10.1587/ELEX.12.20150694

access: open

type: Journal Article

metadata version: 2021-02-12

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  - journals/ieiceee/LiZFZJGZJSH15
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  - https://dblp.org/rec/journals/ieiceee/LiZFZJGZJSH15
Xiangdong Li, Weihang Zhang, Mengdi Fu, Jincheng Zhang, Haiqing Jiang, Zhenxing Guo, Yu Zou, Renyuan Jiang, Zuo-Chen Shi, Yue Hao:
AlGaN channel MIS-HEMTs with a very high breakdown electric field and excellent high-temperature performance. IEICE Electron. Express 12(20): 20150694 (2015)

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