default search action

combined dblp search
author search
venue search
publication search

ask others

"An Auto-Calibrated Resistive Measurement System With Low Noise ..."

Meraj Ahmad et al. (2020)

> Home

Details and statistics

DOI: 10.1109/JSSC.2020.3017639

access: closed

type: Journal Article

metadata version: 2020-12-01

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jssc/AhmadMDBMNAB20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jssc/AhmadMDBMNAB20
Meraj Ahmad, Shahid Malik, Sourya Dewan, Arnesh K. Bose, Dinesh Maddipatla, Binu B. Narakathu, Massood Z. Atashbar, Maryam Shojaei Baghini:
An Auto-Calibrated Resistive Measurement System With Low Noise Instrumentation ASIC. IEEE J. Solid State Circuits 55(11): 3036-3050 (2020)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.