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"SET and noise fault tolerant circuit design techniques: Application to 7 ..."

Antonio Calomarde et al. (2014)

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DOI: 10.1016/J.MICROREL.2013.12.018

access: closed

type: Journal Article

metadata version: 2023-07-06

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Antonio Calomarde, Esteve Amat, Francesc Moll, Julio Vigara, Antonio Rubio:
SET and noise fault tolerant circuit design techniques: Application to 7 nm FinFET. Microelectron. Reliab. 54(4): 738-745 (2014)

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