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"Hot-carrier-induced time dependent dielectric breakdown in high voltage ..."

F. Alagi (2011)

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DOI: 10.1016/J.MICROREL.2011.03.036

access: closed

type: Journal Article

metadata version: 2020-02-22

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F. Alagi:
Hot-carrier-induced time dependent dielectric breakdown in high voltage pMOSFETs. Microelectron. Reliab. 51(8): 1283-1288 (2011)

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