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"Failure mechanism analysis of fuses subjected to manufacturing and ..."

Amir Sajjad Bahman, S. M. Jensen, Francesco Iannuzzo (2018)

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DOI: 10.1016/J.MICROREL.2018.06.108

access: closed

type: Journal Article

metadata version: 2024-10-06

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Amir Sajjad Bahman, S. M. Jensen, Francesco Iannuzzo:
Failure mechanism analysis of fuses subjected to manufacturing and operational thermal stresses. Microelectron. Reliab. 88-90: 304-308 (2018)

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