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"Functional fault models for non-scan sequential circuits."

Eduardas Bareisa et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.07.069

access: closed

type: Journal Article

metadata version: 2023-03-21

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Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas:
Functional fault models for non-scan sequential circuits. Microelectron. Reliab. 51(12): 2402-2411 (2011)

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