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"The analysis of I-V characteristics of Schottky diodes by thermionic ..."

Ilbilge Dökme (2011)

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DOI: 10.1016/J.MICROREL.2010.08.017

access: closed

type: Journal Article

metadata version: 2021-10-14

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Ilbilge Dökme:
The analysis of I-V characteristics of Schottky diodes by thermionic emission with a Gaussian distribution of barrier height. Microelectron. Reliab. 51(2): 360-364 (2011)

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