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"Analysis of critical-length data from Electromigration failure studies."

Vincent M. Dwyer (2011)

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DOI: 10.1016/J.MICROREL.2011.06.036

access: closed

type: Journal Article

metadata version: 2020-02-22

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Vincent M. Dwyer:
Analysis of critical-length data from Electromigration failure studies. Microelectron. Reliab. 51(9-11): 1568-1572 (2011)

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