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"Electrostatic discharge directly to the chip surface, caused by automatic ..."

Peter Jacob, Uwe Thiemann, Joachim C. Reiner (2005)

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DOI: 10.1016/J.MICROREL.2004.10.012

access: closed

type: Journal Article

metadata version: 2020-02-22

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Peter Jacob, Uwe Thiemann, Joachim C. Reiner:
Electrostatic discharge directly to the chip surface, caused by automatic post-wafer processing. Microelectron. Reliab. 45(7-8): 1174-1180 (2005)

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