default search action

combined dblp search
author search
venue search
publication search

ask others

"Accelerated assessment of fine-grain AVF in NoC using a Multi-Cell Upsets ..."

Jiajia Jiao, Yuzhuo Fu, Shi-Jie Wen (2014)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2014.06.008

access: closed

type: Journal Article

metadata version: 2020-02-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/JiaoFW14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/JiaoFW14
Jiajia Jiao, Yuzhuo Fu, Shi-Jie Wen:
Accelerated assessment of fine-grain AVF in NoC using a Multi-Cell Upsets considered fault injection. Microelectron. Reliab. 54(11): 2629-2640 (2014)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.