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"Effect of negative bias temperature instability induced by a low stress ..."

Seonhaeng Lee et al. (2013)

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DOI: 10.1016/J.MICROREL.2013.07.026

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/LeeKKKSSK13
Seonhaeng Lee, Cheolgyu Kim, Hyeokjin Kim, Gang-Jun Kim, Ji-Hoon Seo, Donghee Son, Bongkoo Kang:
Effect of negative bias temperature instability induced by a low stress voltage on nanoscale high-k/metal gate pMOSFETs. Microelectron. Reliab. 53(9-11): 1351-1354 (2013)

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