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"High brightness GaN LEDs degradation during dc and pulsed stress."

Matteo Meneghini et al. (2006)

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DOI: 10.1016/J.MICROREL.2006.07.050

access: closed

type: Journal Article

metadata version: 2024-05-07

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  - https://dblp.org/rec/journals/mr/MeneghiniPMPTMVZ06
Matteo Meneghini, Simona Podda, A. Morelli, Ruggero Pintus, L. Trevisanello, Gaudenzio Meneghesso, Massimo Vanzi, Enrico Zanoni:
High brightness GaN LEDs degradation during dc and pulsed stress. Microelectron. Reliab. 46(9-11): 1720-1724 (2006)

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