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"Metal defect yield and reliability relationships."

William J. Roesch, Dorothy June M. Hamada (2005)

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DOI: 10.1016/J.MICROREL.2005.01.015

access: closed

type: Journal Article

metadata version: 2020-02-22

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William J. Roesch, Dorothy June M. Hamada:
Metal defect yield and reliability relationships. Microelectron. Reliab. 45(12): 1875-1881 (2005)

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