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"Preliminary, space focused, reliability tests on European GaN HEMTs."

F. Vitobello, A. R. Barnes (2010)

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DOI: 10.1016/J.MICROREL.2010.07.026

access: closed

type: Journal Article

metadata version: 2020-02-22

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F. Vitobello, A. R. Barnes:
Preliminary, space focused, reliability tests on European GaN HEMTs. Microelectron. Reliab. 50(9-11): 1581-1586 (2010)

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