default search action

combined dblp search
author search
venue search
publication search

ask others

"Prediction of cure induced warpage of micro-electronic products."

Jan de Vreugd et al. (2010)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2010.02.028

access: closed

type: Journal Article

metadata version: 2022-06-09

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/VreugdJEB10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/VreugdJEB10
Jan de Vreugd, Kaspar M. B. Jansen, Leo J. Ernst, C. Bohm:
Prediction of cure induced warpage of micro-electronic products. Microelectron. Reliab. 50(7): 910-916 (2010)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.