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"Which process metrics can significantly improve defect prediction models? ..."

Lech Madeyski, Marian Jureczko (2015)

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DOI: 10.1007/S11219-014-9241-7

access: open

type: Journal Article

metadata version: 2020-06-08

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  - journals/sqj/MadeyskiJ15
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  - https://dblp.org/rec/journals/sqj/MadeyskiJ15
Lech Madeyski, Marian Jureczko:
Which process metrics can significantly improve defect prediction models? An empirical study. Softw. Qual. J. 23(3): 393-422 (2015)

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