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"Can fault-exposure-potential estimates improve the fault detection ..."

Wei Chen et al. (2002)

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DOI: 10.1002/STVR.257

access: closed

type: Journal Article

metadata version: 2020-04-01

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Wei Chen, Roland H. Untch, Gregg Rothermel, Sebastian G. Elbaum, Jeffery von Ronne:
Can fault-exposure-potential estimates improve the fault detection abilities of test suites? Softw. Test. Verification Reliab. 12(4): 197-218 (2002)

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