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"Test sequences to achieve high defect coverage for synchronous sequential ..."

Irith Pomeranz, Sudhakar M. Reddy (1998)

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DOI: 10.1109/43.728921

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/PomeranzR98b
Irith Pomeranz, Sudhakar M. Reddy:
Test sequences to achieve high defect coverage for synchronous sequential circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 17(10): 1017-1029 (1998)

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