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"An Efficient Adaptive Importance Sampling Method for SRAM and Analog Yield ..."

Xiao Shi et al. (2020)

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DOI: 10.1109/TCAD.2020.2966481

access: closed

type: Journal Article

metadata version: 2024-01-11

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  - https://dblp.org/rec/journals/tcad/ShiYWZSH20
Xiao Shi, Hao Yan, Jinxin Wang, Jiajia Zhang, Longxing Shi, Lei He:
An Efficient Adaptive Importance Sampling Method for SRAM and Analog Yield Analysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(12): 4999-5010 (2020)

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