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"Identifying Reliability-Critical Primary Inputs of Combinational Circuits ..."

Jie Xiao et al. (2022)

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DOI: 10.1109/TCAD.2022.3142194

access: closed

type: Journal Article

metadata version: 2022-11-13

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  - https://dblp.org/rec/journals/tcad/XiaoCLJZ22
Jie Xiao, Wenbo Chen, Jungang Lou, Jianhui Jiang, Qianwei Zhou:
Identifying Reliability-Critical Primary Inputs of Combinational Circuits Based on the Model of Gate-Sensitive Attributes. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(11): 4708-4720 (2022)

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