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"Improving Diagnostic Resolution of Failing ICs Through Learning."

Yang Xue, Xin Li, Ronald D. Blanton (2018)

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DOI: 10.1109/TCAD.2016.2611499

access: closed

type: Journal Article

metadata version: 2021-11-18

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Yang Xue, Xin Li, Ronald D. Blanton:
Improving Diagnostic Resolution of Failing ICs Through Learning. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(6): 1288-1297 (2018)

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