default search action

combined dblp search
author search
venue search
publication search

ask others

"NBTI and HCI Aging Prediction and Reliability Screening During Production ..."

Liting Yu et al. (2020)

> Home

Details and statistics

DOI: 10.1109/TCAD.2019.2961329

access: closed

type: Journal Article

metadata version: 2022-09-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcad/YuRLW20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcad/YuRLW20
Liting Yu, Jianguo Ren, Xian Lu, Xiaoxiao Wang:
NBTI and HCI Aging Prediction and Reliability Screening During Production Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(10): 3000-3011 (2020)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.