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"Improved State Integrity of Flip-Flops for Voltage Scaled Retention Under ..."

Sheng Yang et al. (2013)

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DOI: 10.1109/TCSI.2013.2252640

access: closed

type: Journal Article

metadata version: 2023-05-15

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Sheng Yang, S. Saqib Khursheed, Bashir M. Al-Hashimi, David Flynn, Geoff V. Merrett:
Improved State Integrity of Flip-Flops for Voltage Scaled Retention Under PVT Variation. IEEE Trans. Circuits Syst. I Regul. Pap. 60-I(11): 2953-2961 (2013)

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