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"Remaining Useful Life Prediction Based on a General Expression of ..."

Naipeng Li et al. (2017)

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DOI: 10.1109/TIE.2017.2677334

access: closed

type: Journal Article

metadata version: 2024-11-13

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Naipeng Li, Yaguo Lei, Liang Guo, Tao Yan, Jing Lin:
Remaining Useful Life Prediction Based on a General Expression of Stochastic Process Models. IEEE Trans. Ind. Electron. 64(7): 5709-5718 (2017)

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