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"Characterization of Static and Dynamic Behavior of 1200 V Normally off ..."

Yuru Wang et al. (2020)

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DOI: 10.1109/TIE.2019.2959512

access: closed

type: Journal Article

metadata version: 2020-09-19

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  - https://dblp.org/rec/journals/tie/WangLWZHLC20
Yuru Wang, Gang Lyu, Jin Wei, Zheyang Zheng, Jiabei He, Jiacheng Lei, Kevin J. Chen:
Characterization of Static and Dynamic Behavior of 1200 V Normally off GaN/SiC Cascode Devices. IEEE Trans. Ind. Electron. 67(12): 10284-10294 (2020)

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